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Hub AI
Laser beam profiler AI simulator
(@Laser beam profiler_simulator)
Hub AI
Laser beam profiler AI simulator
(@Laser beam profiler_simulator)
Laser beam profiler
A laser beam profiler captures, displays, and records the spatial intensity profile of a laser beam at a particular plane transverse to the beam propagation path. Since there are many types of lasers—ultraviolet, visible, infrared, continuous wave, pulsed, high-power, low-power—there is an assortment of instrumentation for measuring laser beam profiles. No single laser beam profiler can handle every power level, pulse duration, repetition rate, wavelength, and beam size.
Laser beam profiling instruments measure the following quantities:
Instruments and techniques were developed to obtain the beam characteristics listed above. These include:
As of 2002[update], commercial knife-edge measurement systems cost $5,000–$12,000 USD and CCD beam profilers cost $4,000–9,000 USD. The cost of CCD beam profilers has come down in recent years, primarily driven by lower silicon CCD sensor costs, and as of 2008[update] they can be found for less than $1000 USD.
The applications of laser beam profiling include:
The beam width is the single most important characteristic of a laser beam profile. At least five definitions of beam width are in common use: D4σ, 10/90 or 20/80 knife-edge, 1/e2, FWHM, and D86. The D4σ beam width is the ISO standard definition and the measurement of the M2 beam quality parameter requires the measurement of the D4σ widths. The other definitions provide complementary information to the D4σ and are used in different circumstances. The choice of definition can have a large effect on the beam width number obtained, and it is important to use the correct method for any given application. The D4σ and knife-edge widths are sensitive to background noise on the detector, while the 1/e2 and FWHM widths are not. The fraction of total beam power encompassed by the beam width depends on which definition is used.
The M2 parameter is a measure of beam quality; a low M2 value indicates good beam quality and ability to be focused to a tight spot. The value M is equal to the ratio of the beam's angle of divergence to that of a Gaussian beam with the same D4σ waist width. Since the Gaussian beam diverges more slowly than any other beam shape, the M2 parameter is always greater than or equal to one. Other definitions of beam quality have been used in the past, but the one using second moment widths is most commonly accepted.
Beam quality is important in many applications. In fiber-optic communications beams with an M2 close to 1 are required for coupling to single-mode optical fiber. Laser machine shops care a lot about the M2 parameter of their lasers because the beams will focus to an area that is M4 times larger than that of a Gaussian beam with the same wavelength and D4σ waist width before focusing; in other words, the fluence scales as 1/M4. The rule of thumb is that M2 increases as the laser power increases. It is difficult to obtain excellent beam quality and high average power (100 W to kWs) due to thermal lensing in the laser gain medium.
Laser beam profiler
A laser beam profiler captures, displays, and records the spatial intensity profile of a laser beam at a particular plane transverse to the beam propagation path. Since there are many types of lasers—ultraviolet, visible, infrared, continuous wave, pulsed, high-power, low-power—there is an assortment of instrumentation for measuring laser beam profiles. No single laser beam profiler can handle every power level, pulse duration, repetition rate, wavelength, and beam size.
Laser beam profiling instruments measure the following quantities:
Instruments and techniques were developed to obtain the beam characteristics listed above. These include:
As of 2002[update], commercial knife-edge measurement systems cost $5,000–$12,000 USD and CCD beam profilers cost $4,000–9,000 USD. The cost of CCD beam profilers has come down in recent years, primarily driven by lower silicon CCD sensor costs, and as of 2008[update] they can be found for less than $1000 USD.
The applications of laser beam profiling include:
The beam width is the single most important characteristic of a laser beam profile. At least five definitions of beam width are in common use: D4σ, 10/90 or 20/80 knife-edge, 1/e2, FWHM, and D86. The D4σ beam width is the ISO standard definition and the measurement of the M2 beam quality parameter requires the measurement of the D4σ widths. The other definitions provide complementary information to the D4σ and are used in different circumstances. The choice of definition can have a large effect on the beam width number obtained, and it is important to use the correct method for any given application. The D4σ and knife-edge widths are sensitive to background noise on the detector, while the 1/e2 and FWHM widths are not. The fraction of total beam power encompassed by the beam width depends on which definition is used.
The M2 parameter is a measure of beam quality; a low M2 value indicates good beam quality and ability to be focused to a tight spot. The value M is equal to the ratio of the beam's angle of divergence to that of a Gaussian beam with the same D4σ waist width. Since the Gaussian beam diverges more slowly than any other beam shape, the M2 parameter is always greater than or equal to one. Other definitions of beam quality have been used in the past, but the one using second moment widths is most commonly accepted.
Beam quality is important in many applications. In fiber-optic communications beams with an M2 close to 1 are required for coupling to single-mode optical fiber. Laser machine shops care a lot about the M2 parameter of their lasers because the beams will focus to an area that is M4 times larger than that of a Gaussian beam with the same wavelength and D4σ waist width before focusing; in other words, the fluence scales as 1/M4. The rule of thumb is that M2 increases as the laser power increases. It is difficult to obtain excellent beam quality and high average power (100 W to kWs) due to thermal lensing in the laser gain medium.
