Built-in self-test
Built-in self-test
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Built-in self-test

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Built-in self-test

A built-in self-test (BIST) or built-in test (BIT) is a mechanism that permits a machine to test itself. Engineers design BISTs to meet requirements such as:

or constraints such as:

The main purpose of BIST is to reduce the complexity, and thereby decrease the cost and reduce reliance upon external (pattern-programmed) test equipment. BIST reduces cost in two ways:

Both lead to a reduction in hourly charges for automated test equipment (ATE) service.

BIST is commonly placed in weapons, avionics, medical devices, automotive electronics, complex machinery of all types, unattended machinery of all types, and integrated circuits.

Automotive tests itself to enhance safety and reliability. For example, most vehicles with anti-lock brakes test them once per safety interval. If the anti-lock brake system has a broken wire or other fault, the brake system reverts to operating as a normal brake system. Most automotive engine controllers incorporate a "limp mode" for each sensor, so that the engine will continue to operate if the sensor or its wiring fails. Another, more trivial example of a limp mode is that some cars test door switches, and automatically turn lights on using seat belt occupancy sensors if the door switches fail.

Almost all avionics now incorporate BIST. In avionics, the purpose is to isolate failing line-replaceable units, which are then removed and repaired elsewhere, usually in depots or at the manufacturer. Commercial aircraft only make money when they fly, so they use BIST to minimize the time on the ground needed for repair and to increase the level of safety of the system which contains BIST. Similar arguments apply to military aircraft. When BIST is used in flight, a fault causes the system to switch to an alternative mode or equipment that still operates. Critical flight equipment is normally duplicated, or redundant. Less critical flight equipment, such as entertainment systems, might have a "limp mode" that provides some functions.

Built-in self-test is used to make faster, less-expensive integrated circuit manufacturing tests. The IC has a function that verifies all or a portion of the internal functionality of the IC. In some cases, this is valuable to customers, as well. For example, a BIST mechanism is provided in advanced fieldbus systems to verify functionality. At a high level this can be viewed similar to the PC BIOS's power-on self-test (POST) that performs a self-test of the RAM and buses on power-up.

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