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Shmoo plot
In electrical engineering, a shmoo plot is a graphical display of the response of a component or system varying over a range of conditions or inputs.
The origin of the shmoo plot is unclear. It is referenced in a 1966 IEEE paper. Another early reference is in manuals for IBM 2365 Processor Storage.
The invention of the shmoo plot is sometimes credited to VLSI Hall Of Fame inductee Robert Huston (1941–2006). But this is unlikely because Huston did not begin working as a test engineer until 1967.
The plot takes its name from the Shmoo, a fictional species created by Al Capp in the cartoon Li'l Abner. These small, blob-like creatures have shapes similar to the "working" volumes that would be enclosed by shmoo plots drawn against three independent variables (such as voltage, temperature, and response speed).
Semiconductor chips do not usually exhibit "shmoo" shape plots.[citation needed] Historically, testing of magnetic core memory arrays produced the "shmoo" shape and the term continued into the semiconductor era.
Shmoo plots are often used to represent the results of the testing of complex electronic systems such as computers or integrated circuits such as DRAMs, ASICs or microprocessors. The plot usually shows the range of conditions in which the device under test operates (in adherence with some remaining set of specifications).
For example, when testing semiconductor memory: voltages, temperature, and refresh rates can be varied over specified ranges and only certain combinations of these factors will allow the device to operate. Plotted on independent axes (voltage, temperature, refresh rates), the range of working values will enclose a three-dimensional, usually oddly-shaped volume. Other examples of conditions and inputs that can be varied include frequency, temperature, timing parameters, system- or component-specific variables, and even varying knobs tweakable during silicon chip fabrication producing parts of varying quality which are then used in the process.
Often one 'knob' or variable is plotted on one axis against another knob or variable on another axis, producing a two-dimensional graph. This allows the test engineer to visually observe the operating ranges of the device under test. This process of varying the conditions and inputs to the component or system may sometimes be referred to as 'shmooing' but more officially known as electrical testing or qualification. Automatic test equipment often contains software features that allow automated shmooing of a part.
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Shmoo plot
In electrical engineering, a shmoo plot is a graphical display of the response of a component or system varying over a range of conditions or inputs.
The origin of the shmoo plot is unclear. It is referenced in a 1966 IEEE paper. Another early reference is in manuals for IBM 2365 Processor Storage.
The invention of the shmoo plot is sometimes credited to VLSI Hall Of Fame inductee Robert Huston (1941–2006). But this is unlikely because Huston did not begin working as a test engineer until 1967.
The plot takes its name from the Shmoo, a fictional species created by Al Capp in the cartoon Li'l Abner. These small, blob-like creatures have shapes similar to the "working" volumes that would be enclosed by shmoo plots drawn against three independent variables (such as voltage, temperature, and response speed).
Semiconductor chips do not usually exhibit "shmoo" shape plots.[citation needed] Historically, testing of magnetic core memory arrays produced the "shmoo" shape and the term continued into the semiconductor era.
Shmoo plots are often used to represent the results of the testing of complex electronic systems such as computers or integrated circuits such as DRAMs, ASICs or microprocessors. The plot usually shows the range of conditions in which the device under test operates (in adherence with some remaining set of specifications).
For example, when testing semiconductor memory: voltages, temperature, and refresh rates can be varied over specified ranges and only certain combinations of these factors will allow the device to operate. Plotted on independent axes (voltage, temperature, refresh rates), the range of working values will enclose a three-dimensional, usually oddly-shaped volume. Other examples of conditions and inputs that can be varied include frequency, temperature, timing parameters, system- or component-specific variables, and even varying knobs tweakable during silicon chip fabrication producing parts of varying quality which are then used in the process.
Often one 'knob' or variable is plotted on one axis against another knob or variable on another axis, producing a two-dimensional graph. This allows the test engineer to visually observe the operating ranges of the device under test. This process of varying the conditions and inputs to the component or system may sometimes be referred to as 'shmooing' but more officially known as electrical testing or qualification. Automatic test equipment often contains software features that allow automated shmooing of a part.