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Laser flash analysis
Laser flash analysis
from Wikipedia
Laser Flash Apparatus
State-of-the-art laser flash apparatus to measure thermal diffusivity of a multiplicity of different materials over a broad temperature range (-125 … 2800°C).

The laser flash analysis or laser flash method is used to measure thermal diffusivity of a variety of different materials. An energy pulse heats one side of a plane-parallel sample and the resulting time dependent temperature rise on the backside due to the energy input is detected. The higher the thermal diffusivity of the sample, the faster the energy reaches the backside. A laser flash apparatus (LFA) to measure thermal diffusivity over a broad temperature range, is shown on the right hand side.

In a one-dimensional, adiabatic case the thermal diffusivity is calculated from this temperature rise as follows:

Where

  • is the thermal diffusivity in cm2/s
  • is the thickness of the sample in cm
  • is the time to the half maximum in s

As the coefficient 0.1388 is dimensionless, the formula works also for and in their corresponding SI units.

Measurement principle

[edit]
LFA measurement principle: An energy / laser pulse (red) heats the sample (yellow) on the bottom side and a detector detects the temperature signal versus time on the top side (green).

The laser flash method was developed by Parker et al. in 1961.[1] In a vertical setup, a light source (e.g. laser, flashlamp) heats the sample from the bottom side and a detector on top detects the time-dependent temperature rise. For measuring the thermal diffusivity, which is strongly temperature-dependent, at different temperatures the sample can be placed in a furnace at constant temperature.

Perfect conditions are

  • homogeneous material,
  • a homogeneous energy input on the front side
  • a time-dependent short pulse – in form of a Dirac delta function

Several improvements on the models have been made. In 1963 Cowan takes radiation and convection on the surface into account.[2] Cape and Lehman consider transient heat transfer, finite pulse effects and also heat losses in the same year.[3] Blumm and Opfermann improved the Cape-Lehman-Model with high order solutions of radial transient heat transfer and facial heat loss, non-linear regression routine in case of high heat losses and an advanced, patented pulse length correction.[4][5]

See also

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References

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Revisions and contributorsEdit on WikipediaRead on Wikipedia
from Grokipedia
Laser flash analysis (LFA), also known as the laser flash method, is a transient, non-contact technique primarily used to measure the thermal diffusivity of solid materials by applying a brief, high-energy to one surface of a thin, disk-shaped sample and detecting the resulting rise on the opposite surface with an . The method relies on the principles of one-dimensional heat conduction under adiabatic boundary conditions, where the time required for the rear-surface to reach half its maximum value (t1/2) is used to calculate (α) via the formula α = 0.1388 d2 / t1/2, with d being the sample thickness. Originally developed in 1961 by W. J. Parker and colleagues using a photographic flash lamp, the technique has evolved to employ for enhanced control and precision, enabling simultaneous determination of related properties like thermal conductivity (λ = α · ρ · cp, where ρ is and cp is ) and specific heat when calibrated against reference materials. Standardized as ASTM E1461, LFA is extensively applied in , , and industries to evaluate properties of metals, ceramics, composites, and thin films, often at high temperatures up to 2800 K. Its advantages include rapid testing (typically 40–200 ms per measurement), minimal sample preparation (disks of 6–25 mm diameter and 0.5–5 mm thickness), and high accuracy for isotropic, homogeneous solids, making it superior to steady-state methods like the guarded for high-temperature or low-conductivity materials. However, limitations arise with anisotropic, porous, or thin samples (<0.2 mm), where radiation losses, finite pulse duration, or non-uniform heating can introduce errors up to 5–10%, necessitating corrections or complementary techniques like differential scanning calorimetry for specific heat validation.

Overview

Definition and Purpose

Laser flash analysis (LFA), also known as the laser flash method, is a transient technique for measuring the thermal diffusivity of solid materials by directing a short energy pulse, typically from a laser, onto one side of a thin, disk-shaped sample and recording the resulting temperature rise on the opposite side using an infrared detector. This method assumes one-dimensional heat flow through the sample, enabling rapid assessment of how quickly heat propagates within the material. The primary purpose of LFA is to determine the thermal diffusivity (α\alpha) of materials, a key property that quantifies their ability to conduct thermal energy relative to their heat storage capacity. Thermal diffusivity values obtained via LFA can then be combined with independently measured density (ρ\rho) and specific heat capacity (cpc_p) to compute thermal conductivity using the relation k=αρcpk = \alpha \cdot \rho \cdot c_p, providing essential insights into heat transfer behavior for material design and performance evaluation. This technique is particularly valuable in fields requiring precise characterization of thermal properties under varying conditions, such as in aerospace and electronics applications. LFA typically requires opaque, homogeneous samples in the form of thin disks with diameters of 6 to 25 mm and thicknesses of 0.1 to 6 mm, depending on material properties and instrumentation, to promote uniform energy absorption and unidirectional heat diffusion while minimizing edge effects. Translucent samples may need surface coatings, such as graphite, to ensure opacity to the laser wavelength. Key advantages of LFA include its speed, with measurements completed in seconds, non-destructive nature, and applicability across a broad temperature range from -150°C to 2800°C, depending on the instrumentation, making it suitable for both cryogenic and high-temperature studies. Invented by Parker et al. in 1961, it remains a foundational approach for thermal property analysis.

Historical Development

The laser flash analysis technique was invented in 1961 by W.J. Parker, R.J. Jenkins, C.P. Butler, and G.L. Abbott at the National Bureau of Standards (now NIST) in Boulder, Colorado. Their pioneering work, detailed in a seminal paper published in the Journal of Applied Physics, introduced the flash method as a transient technique for measuring thermal diffusivity, heat capacity, and thermal conductivity of solids, assuming adiabatic conditions to simplify analysis. This innovation addressed limitations of steady-state methods by using a short energy pulse to heat one face of a sample while monitoring the temperature rise on the opposite face, enabling rapid and precise assessments. Following its introduction, the technique rapidly gained adoption in the 1960s, particularly for evaluating thermal properties of metals and ceramics, due to its operational simplicity, minimal sample preparation, and ability to avoid convective heat losses inherent in steady-state approaches. Early refinements addressed practical challenges, such as non-ideal pulse shapes; for instance, R.D. Cowan's 1963 analysis proposed corrections for irregular heat inputs, enhancing accuracy in real-world applications. The first commercial instruments emerged in the late 1960s, with companies like Anter Corporation (founded 1968) pioneering systems that made the method accessible beyond research laboratories. Key advancements in subsequent decades expanded the technique's scope and reliability. In the 1970s, adaptations enabled measurements at elevated temperatures, supporting studies of refractory materials under industrial conditions. The 1980s saw integration of infrared detectors, which improved temporal resolution and sensitivity for detecting subtle temperature transients, particularly in low-diffusivity materials. Standardization efforts culminated in the 1990s with the adoption of ASTM E1461 in 1992, providing a rigorous protocol for thermal diffusivity measurements by the flash method and promoting consistency across global laboratories. By the 2000s, progress in laser technology, including shorter pulse durations and higher energies, facilitated analysis of thinner samples and multilayer structures, broadening applications in microelectronics and advanced composites. In the 2010s and 2020s, further improvements included theoretical models for multi-layer heat conduction and automated commercial systems, such as LINSEIS's enhanced LFA released in 2022, enabling precise measurements on thin films and integrated data analytics as of 2025.

Measurement Principle

Theoretical Foundation

The theoretical foundation of laser flash analysis rests on the one-dimensional unsteady heat conduction equation, which describes the diffusion of heat through the sample material following absorption of a short laser pulse. The governing equation is Tt=α2Tx2,\frac{\partial T}{\partial t} = \alpha \frac{\partial^2 T}{\partial x^2}, where T(x,t)T(x, t) represents the temperature at position xx (along the sample thickness) and time tt, and α=k/(ρcp)\alpha = k / (\rho c_p) is the thermal diffusivity, with kk denoting thermal conductivity, ρ\rho the material density, and cpc_p the specific heat capacity at constant pressure. This parabolic partial differential equation assumes isotropic material properties, negligible internal heat generation, and heat flow confined to one dimension perpendicular to the pulse-irradiated surface, applicable to thin, disk-like samples where lateral heat losses are minimized. For an idealized semi-infinite solid extending from the front surface (x=0x = 0) to infinity, the laser pulse delivers an instantaneous energy input QQ (in J/m²) absorbed at the surface, modeled as an initial plane heat source. The resulting temperature rise ΔT(x,t)\Delta T(x, t) is given by the fundamental Gaussian solution: ΔT(x,t)=Qρcp4παtexp(x24αt).\Delta T(x, t) = \frac{Q}{\rho c_p \sqrt{4 \pi \alpha t}} \exp\left( -\frac{x^2}{4 \alpha t} \right).
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