Recent from talks
Nothing was collected or created yet.
Process design kit
View on WikipediaA process design kit (PDK) is a set of files used within the semiconductor industry to model a fabrication process for the design tools used to design an integrated circuit. The PDK is created by the foundry defining a certain technology variation for their processes. It is then passed to their customers to use in the design process. The customers may enhance the PDK, tailoring it to their specific design styles and markets. The designers use the PDK to design, simulate, draw and verify the design before handing the design back to the foundry to produce chips. The data in the PDK is specific to the foundry's process variation and is chosen early in the design process, influenced by the market requirements for the chip. An accurate PDK will increase the chances of first-pass successful silicon.
Description
[edit]Different tools in the design flow have different input formats for the PDK data. The PDK engineers have to decide which tools they will support in the design flows and create the libraries and rule sets which support those flows.
A typical PDK contains:
- A primitive device library
- Symbols
- Device parameters
- PCells
- Verification checks
- Design rule checking
- Layout versus schematic
- Antenna and electrical rule check
- Physical extraction
- Technology data
- Layers, layer names, layer/purpose pairs
- Colors, fills and display attributes
- Process constraints
- Electrical rules
- Rule files
- LEF
- Tool dependent rule formats
- Simulation models of primitive devices (SPICE or SPICE derivatives)
- Transistors (typically SPICE)
- Capacitors
- Resistors
- Inductors
- Design rule manual
- A user friendly representation of the process requirements
A PDK may also include standard cell libraries from the foundry, a library vendor or developed internally
References
[edit]Further reading
[edit]- Yu Cao, "Predictive process design kits", ch. 8 in, Predictive Technology Model for Robust Nanoelectronic Design, Springer Science & Business Media, 2011 ISBN 1461404452.
- Lukas Chrostowski, Michael Hochberg, "Process design kit (PDK)", section 10.1 in, Silicon Photonics Design, Cambridge University Press, 2015 ISBN 1107085454.
- Michael Liehr et al., "Silicon photonics integrated circuit process design kit", section 4.8 in, Alan Willner (ed), Optical Fiber Telecommunications, vol. 11, Elsevier, 2019 ISBN 0128165022.
- Ian Robertson, Nutapong Somjit, Mitchai Chongcheawchamnan, "Process design kits for RFIC and MMIC design", section 17.8.1 in, Microwave and Millimetre-Wave Design for Wireless Communications, John Wiley & Sons, 2016 ISBN 1118917219.
Process design kit
View on Grokipedia- Design rules: Minimum feature sizes, spacing, and layer alignments to prevent manufacturing defects.[1]
- Technology files: Definitions of process layers, materials, and etching parameters for layout tools like Cadence Virtuoso.[6]
- Simulation models: SPICE-compatible models for active and passive devices to predict electrical performance.[1]
- Verification decks: Scripts and setups for design rule checking (DRC), layout-versus-schematic (LVS), and parasitic extraction.[1]
- Documentation and guides: Detailed manuals on process capabilities, recommended practices, and qualification procedures.[1]
Overview
Definition
A Process Design Kit (PDK) is a hierarchical collection of digital and analog files provided by semiconductor foundries to accurately model the characteristics of their specific fabrication process technology for use in electronic design automation (EDA) tools.[4] These kits encompass the necessary data and parameters to represent the physical and electrical behaviors of components within a given manufacturing process, enabling designers to create layouts and simulations that align with the foundry's capabilities.[2] Key characteristics of a PDK include its process-specific nature, incorporating parameterized cells (PCells), schematic symbols, and device parameters tailored for elements such as transistors, resistors, and capacitors.[9] PCells allow for scalable and customizable representations of these devices, adjusting geometry and properties based on design inputs to ensure compliance with the technology's constraints.[10] In distinction from broader or generic design kits, a PDK is intrinsically linked to a particular manufacturing node—such as 7 nm or 5 nm—and the proprietary processes of a specific foundry, like TSMC or GlobalFoundries, making it non-transferable across different technologies or providers.[5] This specificity ensures that designs produced using the PDK can be reliably manufactured without requiring additional adaptations.[3] PDKs play a critical role in integrated circuit (IC) design by facilitating accurate simulation and verification of circuits before physical fabrication.[11]Purpose and Importance
The primary purpose of a Process Design Kit (PDK) is to equip integrated circuit (IC) designers with foundry-specific process data, including device models, design rules, and verification tools, enabling accurate simulation, layout, and verification of circuits prior to fabrication. This facilitates the creation of designs that align closely with the target manufacturing process, promoting first-time-right silicon outcomes where the initial fabricated chips meet performance specifications without requiring redesigns.[12][13] PDKs play a critical role in streamlining the IC design process by shortening development cycles through automated verification and reference flows, while minimizing expensive respins caused by process mismatches or yield issues. They support multi-project wafer (MPW) runs, allowing multiple designs from different users to share a single wafer for prototyping, which significantly reduces costs and accelerates validation for early-stage projects. Additionally, PDKs ensure compatibility with advanced nodes, such as those below 20 nm, by incorporating precise rules for lithography, variability modeling, and manufacturability checks tailored to complex fabrication technologies.[12][14][15] The importance of PDKs extends to the broader semiconductor ecosystem, particularly for fabless companies that outsource manufacturing to pure-play foundries, as they provide a secure interface to proprietary process technologies without exposing sensitive fabrication details. This separation of design and production has fueled the fabless model, lowering barriers to entry and enabling rapid innovation in a competitive market. By underpinning efficient design practices, PDKs contribute to the sustained growth of the global semiconductor industry, with sales forecasted to reach $700.9 billion in 2025 according to the World Semiconductor Trade Statistics (WSTS) Spring 2025 report, driven by demand for advanced chips in AI, automotive, and computing applications.[7][16]Components
Device Models and Libraries
Device models and libraries form the core of a Process Design Kit (PDK), providing SPICE-compatible representations of semiconductor devices to enable accurate circuit simulation and behavioral prediction. These models capture the electrical characteristics of both active and passive components, allowing designers to evaluate performance metrics such as current-voltage relationships, capacitances, and noise under various operating conditions. For active devices like MOSFETs, industry-standard compact models such as BSIM (Berkeley Short-channel IGFET Model) and PSP (Penn State Philips model) are commonly included, formulated as sets of physics-based equations implemented in SPICE netlists. BSIM models, developed by the BSIM Group at UC Berkeley, offer scalable and robust simulations for bulk, SOI, and multi-gate MOSFETs, supporting advanced nodes down to 7 nm and below, and are endorsed by the Compact Model Coalition (CMC) as a foundational standard for IC design. Similarly, the PSP model, a surface-potential-based approach jointly developed by NXP Semiconductors and CEA-Leti, provides precise modeling of weak-to-strong inversion transitions, mobility degradation, velocity saturation, and non-quasi-static effects, making it suitable for analog, RF, and digital applications.[17][18][19] Passive devices in PDKs are modeled with SPICE subcircuits that account for frequency-dependent behaviors, parasitics, and quality factors essential for RF and mixed-signal designs. Examples include inductors modeled using scalable geometries with thick metal layers to achieve high Q-factors (>10 at GHz frequencies), varactors represented as voltage-dependent capacitors with junction or MOS structures, resistors with sheet resistance variations, and capacitors like metal-insulator-metal (MIM) types offering densities of 1-2 fF/μm². These models are derived from foundry measurements and integrated into PDKs to support tools like Cadence Spectre or Synopsys HSPICE, ensuring consistency with active device simulations. For instance, Fujitsu's RF CMOS PDKs include such passive models optimized for integration with active components in silicon processes.[20][21] Parameterized cell (PCell) libraries within PDKs facilitate automated layout generation, allowing users to create customizable instances of devices and interconnects without manual drawing. In Cadence Virtuoso environments, PCells are typically scripted in SKILL, a Lisp-like language that defines parametric rules for geometry, such as width, length, and finger count for transistors or spiral patterns for inductors, enabling hierarchical and scalable designs. This approach improves productivity by generating layout views on-the-fly, complete with abstract and symbol representations for schematic-driven layout. For open-source or KLayout-based PDKs, Python scripting is increasingly used via libraries like phidl, supporting photonic and IC components with functions for instantiation and testing, as seen in NIST's OLMAC PDK for superconducting nanowire devices.[22][23] To address process variations, PDKs incorporate statistical models that enable Monte Carlo simulations and corner analysis, quantifying uncertainties from manufacturing fluctuations. Statistical models use parameterized distributions for parameters like threshold voltage and mobility, allowing simulations of thousands of samples to predict yield and mismatch effects. Corner cases, such as TT (typical-typical), FF (fast-fast), and SS (slow-slow), represent extreme global variations: TT for nominal conditions, FF for high-speed/low-leakage scenarios with elevated drive currents, and SS for conservative timing with reduced performance. These are implemented in SPICE decks, often alongside local mismatch models, as exemplified in the ASAP7 predictive PDK for 7-nm FinFETs, where FF and SS corners result in shifts in Idsat relative to TT. Such models are crucial for robust design margins in advanced nodes.[24]Design Rules and Technology Files
The Design Rule Manual (DRM) is a foundational document in a Process Design Kit (PDK) that specifies the physical and layout constraints derived from the semiconductor fabrication process to ensure reliable manufacturability and high yield. It details minimum feature widths, spacings between elements, and enclosure requirements for layers such as polysilicon, metals, and contacts, which are enforced through design rule checks (DRC) in electronic design automation (EDA) tools. In industry practice, the DRM translates complex manufacturing limitations into a structured set of rules, addressing challenges like lithography alignment and etching variations, as demonstrated in the development of open-source libraries for advanced nodes.[25] For a representative example in a generic 45 nm CMOS process, the minimum poly width is 0.06 µm, poly-to-poly spacing is 0.06 µm, and contacts (0.07 µm × 0.07 µm) must be fully enclosed by overlying poly to prevent exposure during etching.[26] Technology files, often provided in formats like .tf for Cadence Virtuoso environments, extend these constraints by defining process-specific layer properties, visual attributes, and additional verification rules within the PDK. These files map layers to GDSII stream numbers and data types (e.g., Nwell as layer 2/0, poly as 3/0, Metal1 as 7/0), specify display colors, line styles, and fill patterns for layout editors, and incorporate density requirements to avoid issues like chemical-mechanical polishing (CMP) dishing or erosion.[27] Density rules typically mandate minimum and maximum metal fill percentages within defined areas, such as 20-80% for Metal1 in a 90 nm generic PDK, to maintain uniform planarization. Antenna rules, integrated into these files, mitigate plasma-induced charging damage by limiting the ratio of exposed interconnect area (e.g., metal perimeter) to connected gate poly area, with thresholds like a maximum effective gate area ratio (EGAR) of 50 for poly layers and up to 400 for Metal1 in open PDKs.[28] These rules often include provisions for protective diodes to extend allowable interconnect lengths, such as up to 4280 µm for Metal1 with a diode in a 130 nm process.[28] Layer Exchange Format (LEF) files in a PDK deliver abstracted physical data for backend design flows, focusing on routing, placement, and timing analysis without revealing proprietary layout details. They include technology sections defining layer properties—such as routing layers with direction (horizontal or vertical), width (e.g., 0.23 µm), spacing (0.23 µm), and pitch (0.56 µm)—along with via rules for interconnect generation, including cut sizes and enclosure overhangs (e.g., 0.05 µm).[29] Macro sections specify cell boundaries, obstruction areas, and pin locations through PORT statements with rectangular or polygonal geometries, such asRECT 0.190 2.380 0.470 2.660 on a metal layer, ensuring tools can identify connection points and enforce spacing to obstructions. Site definitions outline placement grids, like a core site with CLASS CORE; SIZE 4.0 BY 7.0; SYMMETRY X Y, which supports row-based standard cell alignment and symmetry for optimized floorplanning.[29] These elements collectively enable automated place-and-route tools to adhere to process constraints while integrating briefly with device models for holistic verification.[27]
