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Depletion-load NMOS logic
Depletion-load NMOS logic
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A depletion-load and two enhancement-mode NMOS transistor making up NAND gate.

In integrated circuits, depletion-load NMOS is a form of digital logic family that uses only a single power supply voltage, unlike earlier NMOS (n-type metal-oxide semiconductor) logic families that needed multiple power supply voltages. Although manufacturing these integrated circuits required additional processing steps, improved switching speed and the elimination of the extra power supply made this logic family the preferred choice for many microprocessors and other logic elements.

Depletion-mode n-type MOSFETs as load transistors allow single voltage operation and achieve greater speed than possible with enhancement-load devices alone. This is partly because the depletion-mode MOSFETs can be a better current source approximation than the simpler enhancement-mode transistor can, especially when no extra voltage is available (one of the reasons early PMOS and NMOS chips demanded several voltages).

The inclusion of depletion-mode NMOS transistors in the manufacturing process demanded additional manufacturing steps compared to the simpler enhancement-load circuits; this is because depletion-load devices are formed by increasing the amount of dopant in the load transistors channel region, in order to adjust their threshold voltage. This is normally performed using ion implantation.

Although the CMOS process replaced most NMOS designs during the 1980s, some depletion-load NMOS designs are still produced, typically in parallel with newer CMOS counterparts. One example of this is the Z84015[1] and Z84C15.[2]

History and background

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Following the invention of the MOSFET by Mohamed Atalla and Dawon Kahng at Bell Labs in 1959, they demonstrated MOSFET technology in 1960.[3] They fabricated both PMOS and NMOS devices with a 20 μm process. However, the NMOS devices were impractical, and only the PMOS type were practical working devices.[4]

In 1965, Chih-Tang Sah, Otto Leistiko and A.S. Grove at Fairchild Semiconductor fabricated several NMOS devices with channel lengths between 8 μm and 65 μm.[5] Dale L. Critchlow and Robert H. Dennard at IBM also fabricated NMOS devices in the 1960s. The first IBM NMOS product was a memory chip with 1 kb data and 50–100 ns access time, which entered large-scale manufacturing in the early 1970s. This led to MOS semiconductor memory replacing earlier bipolar and ferrite-core memory technologies in the 1970s.[6]

Silicon gate

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In the late 1960s, bipolar junction transistors were faster than (p-channel) MOS transistors then used and were more reliable, but they also consumed much more power, required more area, and demanded a more complicated manufacturing process. MOS ICs were considered interesting but inadequate for supplanting the fast bipolar circuits in anything but niche markets, such as low power applications. One of the reasons for the low speed was that MOS transistors had gates made of aluminum which led to considerable parasitic capacitances using the manufacturing processes of the time. The introduction of transistors with gates of polycrystalline silicon (that became the de facto standard from the mid-1970s to early 2000s) was an important first step in order to reduce this handicap. This new self-aligned silicon-gate transistor was introduced by Federico Faggin at Fairchild Semiconductor in early 1968; it was a refinement (and the first working implementation) of ideas and work by John C. Sarace, Tom Klein and Robert W. Bower (around 1966–67) for a transistor with lower parasitic capacitances that could be manufactured as part of an IC (and not only as a discrete component). This new type of pMOS transistor was 3–5 times as fast (per watt) as the aluminum-gate pMOS transistor, and it needed less area, had much lower leakage and higher reliability. The same year, Faggin also built the first IC using the new transistor type, the Fairchild 3708 (8-bit analog multiplexer with decoder), which demonstrated a substantially improved performance over its metal-gate counterpart. In less than 10 years, the silicon gate MOS transistor replaced bipolar circuits as the main vehicle for complex digital ICs.

NMOS and back-gate bias

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There are a couple of drawbacks associated with PMOS: The electron holes that are the charge (current) carriers in PMOS transistors have lower mobility than the electrons that are the charge carriers in NMOS transistors (a ratio of approximately 2.5), furthermore PMOS circuits do not interface easily with low voltage positive logic such as DTL-logic and TTL-logic (the 7400-series). However, PMOS transistors are relatively easy to make and were therefore developed first — ionic contamination of the gate oxide from etching chemicals and other sources can very easily prevent (the electron based) NMOS transistors from switching off, while the effect in (the electron-hole based) PMOS transistors is much less severe. Fabrication of NMOS transistors therefore has to be many times cleaner than bipolar processing in order to produce working devices.

Early work on NMOS integrated circuit (IC) technology was presented in a brief IBM paper at ISSCC in 1969. Hewlett-Packard then started to develop NMOS IC technology to get the promising speed and easy interfacing for its calculator business.[7] Tom Haswell at HP eventually solved many problems by using purer raw materials (especially aluminum for interconnects) and by adding a bias voltage to make the gate threshold large enough; this back-gate bias remained a de facto standard solution to (mainly) sodium contaminants in the gates until the development of ion implantation (see below). Already by 1970, HP was making good enough nMOS ICs and had characterized it enough so that Dave Maitland was able to write an article about nMOS in the December, 1970 issue of Electronics magazine. However, NMOS remained uncommon in the rest of the semiconductor industry until 1973.[8]

The production-ready NMOS process enabled HP to develop the industry’s first 4-kbit IC ROM. Motorola eventually served as a second source for these products and so became one of the first commercial semiconductor vendors to master the NMOS process, thanks to Hewlett-Packard. A while later, the startup company Intel announced a 1-kbit pMOS DRAM, called 1102, developed as a custom product for Honeywell (an attempt to replace magnetic core memory in their mainframe computers). HP’s calculator engineers, who wanted a similar but more robust product for the 9800 series calculators, contributed IC fabrication experience from their 4-kbit ROM project to help improve Intel DRAM’s reliability, operating-voltage, and temperature range. These efforts contributed to the heavily enhanced Intel 1103 1-kbit pMOS DRAM, which was the world’s first commercially available DRAM IC. It was formally introduced in October 1970, and became Intel’s first really successful product.[9]

Depletion-mode transistors

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Characteristics of depletion-mode MOSFET

Early MOS logic had one transistor type, which is enhancement mode so that it can act as a logic switch. Since suitable resistors were hard to make, the logic gates used saturated loads; that is, to make the one type of transistor act as a load resistor, the transistor had to be turned always on by tying its gate to the power supply (the more negative rail for PMOS logic, or the more positive rail for NMOS logic). Since the current in a device connected that way goes as the square of the voltage across the load, it provides poor pullup speed relative to its power consumption when pulled down. A resistor (with the current simply proportional to the voltage) would be better, and a current source (with the current fixed, independent of voltage) better yet. A depletion-mode device with gate tied to the opposite supply rail is a much better load than an enhancement-mode device, acting somewhere between a resistor and a current source.

The first depletion-load NMOS circuits were pioneered and made by the DRAM manufacturer Mostek, which made depletion-mode transistors available for the design of the original Zilog Z80 in 1975–76.[10] Mostek had the ion implantation equipment needed to create a doping profile more precise than possible with diffusion methods, so that the threshold voltage of the load transistors could be adjusted reliably. At Intel, depletion load was introduced in 1974 by Federico Faggin, an ex-Fairchild engineer and later the founder of Zilog. Depletion-load was first employed for a redesign of one of Intel's most important products at the time, a +5V-only 1Kbit NMOS SRAM called the 2102 (using more than 6000 transistors[11]). The result of this redesign was the significantly faster 2102A, where the highest performing versions of the chip had access times of less than 100ns, taking MOS memories close to the speed of bipolar RAMs for the first time.[12]

Depletion-load NMOS processes were also used by several other manufacturers to produce many incarnations of popular 8-bit, 16-bit, and 32-bit CPUs. Similarly to early PMOS and NMOS CPU designs using enhancement mode MOSFETs as loads, depletion-load nMOS designs typically employed various types of dynamic logic (rather than just static gates) or pass transistors used as dynamic clocked latches. These techniques can enhance the area-economy considerably although the effect on the speed is complex. Processors built with depletion-load NMOS circuitry include the 6800 (in later versions[13]), the 6502, Signetics 2650, 8085, 6809, 8086, Z8000, NS32016, and many others (whether or not the HMOS processors below are included, as special cases).

A large number of support and peripheral ICs were also implemented using (often static) depletion-load based circuitry. However, there were never any standardized logic families in NMOS, such as the bipolar 7400 series and the CMOS 4000 series, although designs with several second source manufacturers often achieved something of a de facto standard component status. One example of this is the NMOS 8255 PIO design, originally intended as an 8085 peripheral chip, that has been used in Z80 and x86 embedded systems and many other contexts for several decades. Modern low power versions are available as CMOS or BiCMOS implementations, similar to the 7400-series.

Intel HMOS

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Intel's own depletion-load NMOS process was known as HMOS, for High density, short channel MOS. The first version was introduced in late 1976 and first used for their static RAM products,[14] it was soon being used for faster and/or less power hungry versions of the 8085, 8086, and other chips.

HMOS continued to be improved and went through four distinct generations. According to Intel, HMOS II (1979) provided twice the density and four times the speed/power product over other typical contemporary depletion-load NMOS processes.[15] This version was widely licensed by 3rd parties, including (among others) Motorola who used it for their Motorola 68000, and Commodore Semiconductor Group, who used it for their MOS Technology 8502 die-shrunk MOS 6502.

The original HMOS process, later referred to as HMOS I, had a channel length of 3 microns, which was reduced to 2 for the HMOS II, and 1.5 for HMOS III. By the time HMOS III was introduced in 1982, Intel had begun a switch to their CHMOS process, a CMOS process using design elements of the HMOS lines. One final version of the system was released, HMOS-IV. A significant advantage to the HMOS line was that each generation was deliberately designed to allow existing layouts to die-shrink with no major changes. Various techniques were introduced to ensure the systems worked as the layout changed.[16][17]

HMOS, HMOS II, HMOS III, and HMOS IV were together used for many different kinds of processors; the 8085, 8048, 8051, 8086, 80186, 80286, and many others, but also for several generations of the same basic design, see datasheets.

Further development

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In the mid-1980s, faster CMOS variants, using similar HMOS process technology, such as Intel's CHMOS I, II, III, IV, etc. started to supplant n-channel HMOS for applications such as the Intel 80386 and certain microcontrollers. A few years later, in the late 1980s, BiCMOS was introduced for high-performance microprocessors as well as for high speed analog circuits. Today, most digital circuits, including the ubiquitous 7400 series, are manufactured using various CMOS processes with a range of different topologies employed. This means that, in order to enhance speed and save die area (transistors and wiring), high speed CMOS designs often employ other elements than just the complementary static gates and the transmission gates of typical slow low-power CMOS circuits (the only CMOS type during the 1960s and 1970s). These methods use significant amounts of dynamic circuitry in order to construct the larger building blocks on the chip, such as latches, decoders, multiplexers, and so on, and evolved from the various dynamic methodologies developed for NMOS and PMOS circuits during the 1970s.

Compared to CMOS

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Compared to static CMOS, all variants of NMOS (and PMOS) are relatively power hungry in steady state. This is because they rely on load transistors working as resistors, where the quiescent current determines the maximum possible load at the output as well as the speed of the gate (i.e. with other factors constant). This contrasts to the power consumption characteristics of static CMOS circuits, which is due only to the transient power draw when the output state is changed and the p- and n-transistors thereby briefly conduct at the same time. However, this is a simplified view, and a more complete picture has to also include the fact that even purely static CMOS circuits have significant leakage in modern tiny geometries, as well as the fact that modern CMOS chips often contain dynamic and/or domino logic with a certain amount of pseudo nMOS circuitry.[18]

Evolution from preceding NMOS types

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Depletion-load processes differ from their predecessors in the way the Vdd voltage source, representing 1, connects to each gate. In both technologies, each gate contains one NMOS transistor which is permanently turned on and connected to Vdd. When the transistors connecting to 0 turn off, this pull-up transistor determines the output to be 1 by default. In standard NMOS, the pull-up is the same kind of transistor as is used for logic switches. As the output voltage approaches a value less than Vdd, it gradually switches itself off. This slows the 0 to 1 transition, resulting in a slower circuit. Depletion-load processes replace this transistor with a depletion-mode NMOS at a constant gate bias, with the gate tied directly to the source. This alternative type of transistor acts as a current source until the output approaches 1, then acts as a resistor. The result is a faster 0 to 1 transition.

Static power consumption

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An NMOS NAND gate with saturated enhancement-mode load device. The enhancement device can also be used with a more positive gate bias in a non-saturated configuration, which is more power efficient but requires a high gate voltage and a longer transistor. Neither is as power efficient or compact as a depletion load.

Depletion-load circuits consume less power than enhancement-load circuits at the same speed. In both cases the connection to 1 is always active, even when the connection to 0 is also active. This results in high static power consumption. The amount of waste depends on the strength, or physical size, of the pull-up. Both (enhancement-mode) saturated-load and depletion-mode pull-up transistors use greatest power when the output is stable at 0, so this loss is considerable. Because the strength of a depletion-mode transistor falls off less on the approach to 1, they may reach 1 faster despite starting slower, i.e. conducting less current at the beginning of the transition and at steady state.

Notes and references

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Revisions and contributorsEdit on WikipediaRead on Wikipedia
from Grokipedia
Depletion-load is a digital logic family implemented in integrated circuits using n-channel metal-oxide-semiconductor () transistors, where enhancement-mode NMOS devices function as the switching elements (drivers) and depletion-mode NMOS transistors serve as active loads with their gates connected to their sources, enabling operation as a high-impedance pull-up network that conducts at zero gate-to-source voltage due to the load's negative . This configuration allows the logic to function with a single positive voltage, providing full output voltage swing to VDD and sharper transitions in voltage transfer characteristics compared to earlier enhancement-load NMOS designs. Developed as an advancement over mid-1970s enhancement-load NMOS logic, depletion-load NMOS emerged in the late and early , dominating the fabrication of high-density microprocessors and chips during that era due to its improved performance and relative simplicity in scaling densities. In typical circuits like inverters or NAND gates, the depletion-mode load operates in either the or saturation region depending on the output voltage, with its drain current modeled approximately as iD = K(VTN)2 for saturation (where K is the process and VTN is the negative threshold), approximating a source despite body effect influences that slightly degrade its ideality. This load arrangement ensures that when the input is low, the driver is off and the output charges to VDD; when the input is high, the driver conducts and pulls the output low, with the load's current limiting static power dissipation more effectively than resistive or saturated enhancement loads. Key advantages of depletion-load NMOS logic include superior noise margins, reduced chip area due to fewer required transistors per gate, and compatibility with high-speed operation in large-scale integration (LSI), though it demands an extra ion-implantation step during fabrication to create the depletion-mode channel, increasing process complexity slightly. Compared to its predecessor, the enhancement-load variant, it eliminates the output voltage drop below VDD and provides more abrupt switching, enhancing overall circuit reliability and speed. However, despite these benefits, the technology's higher static power consumption—stemming from the always-on load transistor—made it less efficient than emerging complementary MOS (CMOS) logic, leading to its obsolescence by the mid-1980s as CMOS became the standard for low-power, high-density applications. Today, depletion-load NMOS survives primarily in niche or legacy systems, underscoring its role as a pivotal transitional technology in the evolution of VLSI design.

Overview

Definition and principles

Depletion-load NMOS logic is a digital logic family employing n-channel metal-oxide-semiconductor field-effect transistors (MOSFETs), in which enhancement-mode devices constitute the pull-down network responsible for discharging the output to ground, while depletion-mode devices serve as active loads to charge the output toward the supply voltage. This architecture enables operation using a single power supply voltage, typically 5 V, eliminating the need for an additional bias supply required in earlier NMOS designs. The technology played a foundational role in early digital integrated circuits by improving power efficiency and voltage swing characteristics. Enhancement-mode NMOS transistors feature a positive (V_th > 0 V), remaining off when the gate-to-source voltage (V_GS) is zero and conducting only when V_GS exceeds V_th, making them suitable for logic switching elements. In contrast, depletion-mode NMOS transistors possess a negative (V_th < 0 V), forming a conductive channel at V_GS = 0 V and requiring a negative V_GS to deplete the channel and turn off; these are fabricated with an ion-implanted n-type dopant in the channel region to achieve this normally-on behavior. In logic circuits, the depletion-mode load transistor has its gate tied to the source, configuring it as a two-terminal device that functions as a nonlinear current source or resistor, providing a stable pull-up path without additional control signals. The operating principles rely on the complementary roles of these transistor types to achieve defined logic levels: a logic low output (V_OL) approximates 0 V when the enhancement-mode pull-down network conducts, fully discharging the load capacitance, while a logic high output (V_OH) reaches approximately V_DD when the pull-down is off, as the depletion-mode load operates in its triode region to supply current until equilibrium. Unlike resistive loads, which suffer from high power dissipation and limited voltage swing, or enhancement-mode loads needing a separate elevated supply (V_GG ≈ V_DD + V_th) for activation, the depletion-mode load remains conducting at zero gate bias, behaving as a constant current source in saturation during switching and enabling full rail-to-rail output swing (0 V to V_DD) with enhanced noise margins and transient performance. This single-supply capability arose from advancements in ion implantation for threshold adjustment, allowing the load to mimic a current source over a wide voltage range.

Basic circuit elements

The fundamental building blocks of depletion-load NMOS logic are enhancement-mode NMOS transistors serving as drivers and depletion-mode NMOS transistors functioning as loads. Enhancement-mode NMOS transistors possess a positive threshold voltage (V_th > 0 V), rendering them non-conductive at zero gate-to-source voltage (V_GS = 0 V). Depletion-mode NMOS transistors, however, conduct at V_GS = 0 V owing to an implanted channel doping that establishes a pre-existing conductive path between drain and source, enabling them to act as active loads without requiring a separate for . A representative schematic is the depletion-load NMOS inverter, which connects these elements in a pull-up/pull-down configuration. The load transistor, a depletion-mode NMOS, has its gate connected to its source (ensuring V_GS = 0 V), its drain tied to the positive supply V_DD, and its source linked to the output node. The driver transistor, an enhancement-mode NMOS, has its drain connected to the output node, its source grounded, and its gate as the logic input. This arrangement allows the inverter to swing the output close to V_DD when the input is low, leveraging the always-on characteristic of the load. The fabrication process for depletion-mode transistors incorporates an extra masked step to shift the negatively, typically to approximately -3 V, by introducing atoms that form the implanted channel. This adjustment distinguishes depletion-mode devices from enhancement-mode ones in the same NMOS process flow. Depletion-load NMOS operates as ratioed logic, where circuit performance—such as noise margins and switching thresholds—depends on the ratio of the driver's parameter (β_driver) to the load's (β_load), commonly set between 4:1 and 8:1 through (W/L) of the transistors.

Historical Development

Early MOS technologies

The metal-oxide-semiconductor field-effect transistor (MOSFET) was first demonstrated in 1959 by and at Bell Laboratories. Their device utilized a thermally grown layer to overcome surface state issues, enabling effective gate control of the channel through an . Although the initial MOSFET operated slowly compared to bipolar transistors and was not immediately adopted for telephony applications, it laid the foundation for potential. Early adoption of in the 1960s favored p-channel MOSFETs (PMOS) due to simpler control and greater stability against mobile , such as sodium, which was prevalent in fabrication processes. NMOS devices, in contrast, suffered from elevated threshold voltages caused by positive fixed charges in the layer, alongside poor quality leading to where device characteristics could shift by over 100 volts under varying conditions. Parasitic effects, including high gate-to-source/drain overlap in metal-gate structures, further limited performance and density, delaying NMOS viability. Key advancements began with Fairchild Semiconductor's MOS research in 1963, where teams developed early integrated circuits using PMOS transistors, including flip-flops with yields exceeding 80%. That same year, the first commercial MOS IC—a 20-bit PMOS with 120 transistors—was introduced by General Microelectronics, employing a two-phase clock for logic applications. also pursued MOS memory in the early 1960s, fabricating initial devices that contributed to the transition toward semiconductor-based storage. A pivotal milestone came in 1968 when and Tom Klein at Fairchild pioneered the silicon-gate process, replacing aluminum gates with to enable self-alignment. This innovation reduced parasitic overlap capacitance, boosting speed by 3 to 5 times and doubling packing density while enhancing reliability. The shift toward NMOS gained momentum as engineers recognized the 2-3 times higher electron mobility in silicon compared to hole mobility in PMOS, promising faster switching speeds. However, persistent threshold voltage challenges in NMOS required solutions like back-gate bias to adjust the body potential and lower the effective gate threshold. These techniques, combined with improved oxide processes, set the stage for NMOS dominance by the late 1960s.

Advancements in NMOS

In the early 1970s, NMOS technology advanced through the adoption of silicon-gate processes, which enabled self-aligned gates and significantly reduced parasitic capacitances, allowing for smaller transistor sizes and higher integration densities compared to earlier metal-gate approaches. This shift facilitated the scaling of NMOS devices to feature sizes around 1 μm, as demonstrated at the 1972 International Electron Devices Meeting, paving the way for practical large-scale integration (LSI). A key commercial success was Intel's 2102, a 1 Kbit static RAM introduced in 1972, which marked one of the first widely adopted NMOS silicon-gate memory chips and highlighted the technology's viability for high-density applications. To address challenges like threshold voltage instability caused by sodium contamination in the gate oxide, engineers implemented back-gate bias techniques, applying a negative substrate voltage (V_{BB} < 0) to the p-type body of NMOS transistors. This substrate biasing optimized turn-on characteristics by countering ion-induced shifts, thereby improving device reliability and overall circuit speed without requiring major process changes. Hewlett-Packard's Loveland division pioneered this in their NMOS ICs starting around 1970, using it in early logic chips for calculators and instruments to enhance performance amid fabrication impurities. Initial NMOS logic circuits relied on saturated enhancement-load configurations, where the load transistor's gate was connected to a higher voltage supply (V_{GG} > V_{DD}) to ensure adequate drive current. However, this approach necessitated multiple power supplies, complicating system design, and resulted in limited switching speeds due to suboptimal high-output voltage levels (V_{OH}), which reduced noise margins and drive capability. By the mid-1970s, NMOS had overtaken PMOS as the dominant technology for LSI and VLSI circuits, driven by its superior , which enabled higher speeds and greater densities at scaled geometries. For instance, NMOS processes allowed 8 Kbit DRAMs to be realized by 1975, a feat that underscored its performance advantages over PMOS in power efficiency and integration scale. This transition solidified NMOS as the foundation for complex digital ICs during the decade.

Introduction of depletion-load

Depletion-load emerged in the mid- as a significant advancement in MOS technology, addressing key limitations of earlier enhancement-load NMOS designs, such as the need for a separate negative gate bias supply (VGG) to activate the load transistor and the resulting restricted output voltage swing. The technique relied on , a process refined in the early 1970s, to dope the channel and achieve negative threshold voltages. The core innovation involved fabricating depletion-mode n-channel MOSFETs as load devices through of into the channel region, which creates a built-in conductive channel and shifts the (Vth) to a negative value, typically around -2 to -3 V. This allows the depletion-mode transistor to operate as a or equivalent at zero gate-to-source voltage (VGS = 0), eliminating the requirement for active biasing of the load. One of the earliest commercial adoptions was by , which utilized this technology to fabricate the in 1976, enabling operation from a single 5 V supply and achieving full output high voltage (VOH) swing to the supply rail. This implementation marked a practical breakthrough, as Mostek's capabilities allowed rapid production scaling for the Z80 design. Compared to enhancement-load predecessors, depletion-load NMOS offered faster rise times for 0-to-1 transitions due to the always-on load, improved noise margins from the rail-to-rail swing, and simplified power distribution without a VGG supply. The process integration required only one additional mask step for the channel implant, making it highly compatible with existing NMOS fabrication lines and facilitating widespread adoption in high-volume production.

Key implementations and evolutions

One of the earliest major commercial implementations of depletion-load was Intel's HMOS (High-performance MOS) process, introduced in late as a high-density, short-channel technology optimized for depletion loads to enhance speed and integration density. The initial HMOS I version featured a minimum feature size around 3 μm, enabling efficient production of static RAMs and logic circuits that outperformed prior enhancement-load designs. Subsequent iterations rapidly scaled the technology: HMOS II, deployed in 1978 for the , reduced features to approximately 2.5–3 μm while incorporating for improved threshold control and performance, allowing clock speeds up to 10 MHz. By 1982, HMOS III further shrank dimensions to 1.5–2.5 μm, as seen in later 8086 variants and the 80286 , which integrated 134,000 transistors on a smaller die for higher density and up to 8 MHz operation. HMOS IV extended this scaling trend into the mid-1980s, pushing toward sub-2 μm nodes before the shift to . Beyond Intel, depletion-load NMOS saw widespread adoption in other prominent microprocessors during the late . The MC68000, released in 1979, utilized a depletion-load NMOS process with a 3 μm feature size, enabling its 16-bit and 4–8 MHz speeds in systems like early workstations and personal computers. MOS Technology's 6502 , introduced in 1975, pioneered affordable depletion-load NMOS implementation on a silicon-gate process, achieving low cost through single-power-supply operation and becoming foundational for devices like the and 400/800; evolutions such as the 65C02 in 1982 refined this with scaled NMOS for better reliability and lower power. Similarly, Zilog's Z80, launched in 1976, employed depletion-load n-channel silicon-gate NMOS with , offering compatibility with the while improving speed to 2.5–4 MHz; variants like the Z80A (1977) and later Z80B (1985) incorporated process tweaks for higher clocks up to 20 MHz before transitions. Process evolutions in the early 1980s focused on scaling and hybrid optimizations to extend NMOS viability. Scaled NMOS variants reached 1–1.5 μm by 1982, as in Intel's HMOS III for the 80286, which reduced die area by over 30% compared to earlier generations while maintaining depletion-load efficiency for complex logic. Power optimizations included techniques like clock gating in NMOS logic trees, which disabled clock signals to inactive sections, reducing dynamic dissipation by up to 50% in multi-clock designs without altering core depletion-load structures. The decline of depletion-load NMOS implementations accelerated in the early due to intensifying competition from , which offered superior static power savings—often orders of magnitude lower than NMOS's constant load currents—making preferable for battery-powered and high-density applications. By mid-decade, most new designs shifted to , relegating depletion-load NMOS to legacy or radiation-hardened niches.

Operation and Design

Inverter and logic gates

The depletion-load NMOS inverter comprises an enhancement-mode NMOS transistor serving as the driver and a depletion-mode NMOS transistor as the , with the load's gate tied to its source to maintain V_{GS,load} = 0 V. When the input voltage V_{IN} is low (V_{IN} = 0 V), the driver transistor enters , resulting in zero drain current; the load transistor, biased in its linear region, charges the output to V_{OUT} = V_{DD}. When V_{IN} is high (V_{IN} = V_{DD}), the driver turns on and enters saturation, discharging the output to a V_{OL} \approx 0 V, while the load operates in saturation. The voltage transfer characteristic (VTC) of the inverter exhibits full output voltage swings, with the high output level V_{OH} = V_{DD} and the low output level V_{OL} = 0 V. The switching threshold V_M, defined as the point where V_{IN} = V_{OUT}, occurs in the transition region and can be approximated by balancing the saturation currents of the driver and load transistors: VMVth,driver+βloadβdriverVth,loadV_M \approx V_{th,driver} + \sqrt{\frac{\beta_{load}}{\beta_{driver}}} \cdot |V_{th,load}|
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