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Non-volatile memory
Non-volatile memory
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Non-volatile memory (NVM) or non-volatile storage is a type of computer memory that can retain stored information even after power is removed. In contrast, volatile memory needs constant power in order to retain data.

Non-volatile memory typically refers to storage in memory chips, which store data in floating-gate memory cells consisting of floating-gate MOSFETs (metal–oxide–semiconductor field-effect transistors), including flash memory storage such as NAND flash and solid-state drives (SSD).

Other examples of non-volatile memory include read-only memory (ROM), EPROM (erasable programmable ROM) and EEPROM (electrically erasable programmable ROM), ferroelectric RAM, most types of computer data storage devices (e.g. disk storage, hard disk drives, optical discs, floppy disks, and magnetic tape), and early computer storage methods such as punched tape and cards.[1]

Overview

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Non-volatile memory is typically used for the task of secondary storage or long-term persistent storage. The most widely used form of primary storage today[as of?] is a volatile form of random access memory (RAM), meaning that when the computer is shut down, anything contained in RAM is lost. However, most forms of non-volatile memory have limitations that make them unsuitable for use as primary storage. Typically, non-volatile memory costs more, provides lower performance, or has a limited lifetime compared to volatile random access memory.

Non-volatile data storage can be categorized into electrically addressed systems, for example, flash memory, and read-only memory) and mechanically addressed systems (hard disks, optical discs, magnetic tape, holographic memory, and such).[2][3] Generally speaking, electrically addressed systems are expensive, and have limited capacity, but are fast, whereas mechanically addressed systems cost less per bit, but are slower.

Electrically addressed

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Electrically addressed semiconductor non-volatile memories can be categorized according to their write mechanism.

Read-only and read-mostly devices

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Mask ROMs are factory programmable only and typically used for large-volume products which are not required to be updated after the memory device is manufactured.

Programmable read-only memory (PROM) can be altered once after the memory device is manufactured using a PROM programmer. Programming is often done before the device is installed in its target system, typically an embedded system. The programming is permanent, and further changes require the replacement of the device. Data is stored by physically altering (burning) storage sites in the device.

An EPROM is an erasable ROM that can be changed more than once. However, writing new data to an EPROM requires a special programmer circuit. EPROMs have a quartz window that allows them to be erased with ultraviolet light, but the whole device is cleared at one time. A one-time programmable (OTP) device may be implemented using an EPROM chip without the quartz window; this is less costly to manufacture. An electrically erasable programmable read-only memory EEPROM uses voltage to erase memory. These erasable memory devices require a significant amount of time to erase data and write new data; they are not usually configured to be programmed by the processor of the target system. Data is stored using floating-gate transistors, which require special operating voltages to trap or release electric charge on an insulated control gate to store information.

Flash memory

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Flash memory is a solid-state chip that maintains stored data without any external power source. It is a close relative to the EEPROM; it differs in that erase operations must be done on a block basis, and its capacity is substantially larger than that of an EEPROM. Flash memory devices use two different technologies—NOR and NAND—to map data. NOR flash provides high-speed random access, reading and writing data in specific memory locations; it can retrieve as little as a single byte. NAND flash reads and writes sequentially at high speed, handling data in blocks. However, it is slower on reading when compared to NOR. NAND flash reads faster than it writes, quickly transferring whole pages of data. Less expensive than NOR flash at high densities, NAND technology offers higher capacity for the same-size silicon.[4]

Ferroelectric RAM (F-RAM)

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Ferroelectric RAM (FeRAM, F-RAM or FRAM) is a form of random-access memory similar in construction to DRAM, both use a capacitor and transistor but instead of using a simple dielectric layer the capacitor, an F-RAM cell contains a thin ferroelectric film of lead zirconate titanate [Pb(Zr,Ti)O3], commonly referred to as PZT. The Zr/Ti atoms in the PZT change polarity in an electric field, thereby producing a binary switch. Due to the PZT crystal maintaining polarity, F-RAM retains its data memory when power is shut off or interrupted.

Due to this crystal structure and how it is influenced, F-RAM offers distinct properties from other nonvolatile memory options, including extremely high, although not infinite, endurance (exceeding 1016 read/write cycles for 3.3 V devices), ultra-low power consumption (since F-RAM does not require a charge pump like other non-volatile memories), single-cycle write speeds, and gamma radiation tolerance.[5]

Magnetoresistive RAM (MRAM)

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Magnetoresistive RAM stores data in magnetic storage elements called magnetic tunnel junctions (MTJs). The first generation of MRAM, such as Everspin Technologies' 4 Mbit, utilized field-induced writing. The second generation is developed mainly through two approaches: Thermal-assisted switching (TAS)[6] which is being developed by Crocus Technology, and Spin-transfer torque (STT) which Crocus, Hynix, IBM, and several other companies are developing.[7]

Phase-change Memory (PCM)

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Phase-change memory stores data in chalcogenide glass, which can reversibly change the phase between the amorphous and the crystalline state, accomplished by heating and cooling the glass. The crystalline state has low resistance, and the amorphous phase has high resistance, which allows currents to be switched ON and OFF to represent digital 1 and 0 states.[8][9]

FeFET memory

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FeFET memory uses a transistor with ferroelectric material to permanently retain state.

RRAM memory

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RRAM (ReRAM) works by changing the resistance across a dielectric solid-state material often referred to as a memristor. ReRAM involves generating defects in a thin oxide layer, known as oxygen vacancies (oxide bond locations where the oxygen has been removed), which can subsequently charge and drift under an electric field. The motion of oxygen ions and vacancies in the oxide would be analogous to the motion of electrons and holes in a semiconductor.

Although ReRAM was initially seen as a replacement technology for flash memory, the cost and performance benefits of ReRAM have not been enough for companies to proceed with the replacement. Apparently, a broad range of materials can be used for ReRAM. However, the discovery [10] that the popular high-κ gate dielectric HfO2 can be used as a low-voltage ReRAM has encouraged researchers to investigate more possibilities.

Mechanically addressed systems

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Mechanically addressed systems use a recording head to read and write on a designated storage medium. Since the access time depends on the physical location of the data on the device, mechanically addressed systems may be sequential access. For example, magnetic tape stores data as a sequence of bits on a long tape; transporting the tape past the recording head is required to access any part of the storage. Tape media can be removed from the drive and stored, giving indefinite capacity at the cost of the time required to retrieve a dismounted tape.[11][12]

Hard disk drives use a rotating magnetic disk to store data; access time is longer than for semiconductor memory, but the cost per stored data bit is very low, and they provide random access to any location on the disk. Formerly, removable disk packs were common, allowing storage capacity to be expanded. Optical discs store data by altering a pigment layer on a plastic disk and are similarly random access. Read-only and read-write versions are available; removable media again allows indefinite expansion, and some automated systems (e.g. optical jukebox) were used to retrieve and mount disks under direct program control.[13][14][15]

Domain-wall memory (DWM) stores data in a magnetic tunnel junctions (MTJs), which works by controlling domain wall (DW) motion in ferromagnetic nanowires.[16]

Organic

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Thinfilm produces rewriteable non-volatile organic ferroelectric memory based on ferroelectric polymers. Thinfilm successfully demonstrated roll-to-roll printed memories in 2009.[17][18][19] In Thinfilm's organic memory the ferroelectric polymer is sandwiched between two sets of electrodes in a passive matrix. Each crossing of metal lines is a ferroelectric capacitor and defines a memory cell.

Non-volatile main memory

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Non-volatile main memory (NVMM) is primary storage with non-volatile attributes.[20] This application of non-volatile memory presents security challenges.[21] NVDIMM is one example of the non-volatile main memory.

References

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Revisions and contributorsEdit on WikipediaRead on Wikipedia
from Grokipedia
Non-volatile memory (NVM), also referred to as non-volatile storage, is a type of that retains stored data even after the power supply is disconnected, in contrast to like (DRAM) which loses its contents without continuous power. The development of NVM has roots in early mechanical systems from the 19th century, such as punched cards and tape, with semiconductor-based NVM emerging in the 1960s through charge-based devices, evolving through programmable read-only memory (PROM) and (EPROM) in the 1970s, and reaching widespread adoption with (EEPROM) and in the 1980s. Common types include mechanically addressed systems such as (e.g., hard disk drives) and optical media (e.g., CDs); (ROM) variants such as mask ROM and PROM for fixed data storage; and , which allow electrical rewriting and are foundational to solid-state drives (SSDs) and USB flash drives; and emerging technologies like (FeRAM), magnetic RAM (MRAM), phase-change memory (PCM), and resistive RAM (ReRAM), which offer potential improvements in speed, density, and energy efficiency for future applications. NVM plays a critical role in modern , serving as secondary storage for operating systems, applications, and user in personal computers, smartphones, and servers; enabling boot firmware in devices like /; and supporting embedded systems in automotive, industrial, and for persistent configuration and code storage. In enterprise environments, NVM technologies such as NAND flash in SSDs provide high-capacity, durable storage with faster access times than traditional hard disk drives, driving advancements in data centers and . Ongoing research into emerging NVM aims to bridge the performance gap with while maintaining persistence, potentially revolutionizing fields like neuromorphic computing and in-memory databases.

Introduction

Definition and characteristics

Non-volatile memory (NVM) is a type of that retains stored data even after the power supply is disconnected, encompassing both electrically addressed technologies and mechanically addressed systems such as magnetic and . This distinguishes it from , which loses data without continuous power. Persistence arises from the memory's ability to store data in stable physical states that do not dissipate upon power removal. Key characteristics of NVM include high data persistence, with typical retention times ranging from 10 years to several decades under standard operating conditions, serving as a primary measure of non-volatility through the duration data can be held without power or refresh. Access times generally fall between tens of microseconds and milliseconds, balancing speed with reliability. Storage density spans from individual bits in embedded systems to terabits in high-capacity devices, enabling scalable data handling. , defined as the number of reliable read/write cycles per cell, varies widely from approximately 10310^3 to 101510^{15}, depending on the underlying and influencing suitability for frequent updates. Power consumption is negligible during retention (effectively zero, as no energy is needed to preserve states) but occurs primarily during read and write operations, often in the range of microwatts to milliwatts per access. At the fundamental level, NVM operates by leveraging durable physical phenomena to encode binary states, such as charge in insulating layers (where electrons are confined in potential wells), magnetic orientation in ferromagnetic materials (aligning spins to represent ), phase changes in chalcogenide alloys (switching between amorphous and crystalline forms), or variable resistance states in metal-oxide films (altering conductivity without ongoing power). These mechanisms ensure bistable or multistable configurations that remain intact post-power-off, contrasting with volatile systems reliant on dynamic charge refresh. in NVM is organized in basic units: a bit (0 or 1), with 8 bits forming a byte; larger blocks like sectors (typically 512 bytes or multiples thereof) facilitate efficient addressing and error management. For charge-based NVM, is often modeled using an framework to predict loss over time due to leakage currents. A simplified equation for retention time trett_{ret} is tret=τln(VinitialVthreshold)t_{ret} = \tau \ln \left( \frac{V_{initial}}{V_{threshold}} \right), where τ\tau represents the characteristic influenced by material properties and , VinitialV_{initial} is the programmed voltage level, and VthresholdV_{threshold} is the minimum voltage distinguishing states. This model highlights how retention degrades exponentially with factors like elevated temperatures or cell wear, guiding reliability assessments.

Comparison to volatile memory

Volatile memory, such as (SRAM) and (DRAM), is characterized by its rapid data access times, typically in the range of 10-50 nanoseconds for DRAM, making it ideal for high-speed caching and temporary data storage in computing systems. However, these technologies require continuous to maintain stored data; upon power loss, all information is erased, as the memory cells rely on active electrical charges or currents to retain state. In contrast, non-volatile memory (NVM) provides persistence, retaining data without power, which is a fundamental advantage over volatile memory's on power-off, enabling reliable long-term storage for applications like boot devices and in embedded systems. While volatile memory excels in read/write speeds—often orders of magnitude faster than NVM, with SRAM achieving sub-nanosecond access—NVM offers higher storage density and lower standby power consumption, though at the cost of slower access times and limited write endurance. For instance, DRAM provides effectively unlimited write cycles and lower cost per compared to many NVM types, whereas NVM like achieves densities up to terabits per chip but with endurance limited to 10,000-100,000 cycles for typical consumer grades. These trade-offs influence their use cases: volatile memory supports transient computations in CPUs and RAM, while NVM serves persistent needs in solid-state drives and . The following table summarizes key trade-offs between representative volatile and non-volatile memory types, highlighting their performance characteristics:
Memory TypeAccess TimeEndurance (Write Cycles)Cost per GigabytePower Consumption (Standby)
DRAM (Volatile)10-50 nsEffectively unlimitedLower (~$3-5/GB as of 2025)Higher (requires refresh)
SRAM (Volatile)<1 nsEffectively unlimitedHigher than DRAMModerate
NAND Flash (NVM)10-100 μs (read), 0.1-1 ms (write)10^4-10^5~$0.05-0.1/GB as of 2025Very low
NOR Flash (NVM)50-100 ns (read), 5-10 μs (write)10^5-10^6Higher than NANDLow
Hybrid systems often combine volatile and non-volatile memory in a memory hierarchy, where volatile components handle fast, temporary operations and NVM provides backing storage for data persistence, optimizing overall system performance and efficiency.

History

Early mechanical and pre-semiconductor developments

The earliest forms of non-volatile data storage emerged in the pre-20th century through mechanical systems designed for pattern control and information retention. In 1801, Joseph Marie Jacquard invented the Jacquard loom, which utilized punched cards to automate the weaving of complex textile patterns, marking the first practical use of punched media for storing and retrieving instructional data without power dependency. These cards, made of stiff paper or cardboard with holes representing binary-like instructions, allowed for repeatable, durable data retention that persisted independently of any energy source. Building on this concept, paper tape emerged as another mechanical storage medium; in 1857, Charles Wheatstone adapted perforated paper strips for telegraphy, enabling the preparation, storage, and transmission of sequential data in a compact, non-volatile format suitable for long-term retention. Entering the early 20th century, magnetic recording techniques introduced more dynamic non-volatile storage options, though some hybrid systems retained mechanical elements. In 1898, Danish engineer Valdemar Poulsen developed the telegraphone, the first magnetic wire recorder, which captured audio signals by magnetizing a steel wire with an electromagnet, providing durable, erasable storage that retained data without continuous power. This innovation laid foundational principles for magnetic media, demonstrating non-volatility through hysteresis in ferromagnetic materials. In 1928, German engineer Fritz Pfleumer advanced the field by patenting magnetic tape, consisting of paper strips coated with iron oxide particles, which offered a flexible, low-cost alternative for recording and storing data magnetically. By 1932, Austrian inventor Gustav Tauschek patented the magnetic drum memory, a rotating cylinder coated with ferromagnetic material that stored binary data via magnetic domains, enabling random access in early computing prototypes and serving as a non-volatile auxiliary storage device. In contrast, mercury delay line memory, developed in the 1940s by researchers like J. Presper Eckert for systems such as ENIAC, relied on acoustic waves propagating through liquid mercury tubes to recirculate data; while mechanically implemented, it was inherently volatile, as information decayed without active regeneration, highlighting the limitations of purely acoustic-mechanical approaches. The 1950s saw refinements in magnetic non-volatile storage, bridging mechanical designs toward more efficient electrical integration. In 1949, Chinese-American physicist An Wang invented the core-and-coil pulse transfer device, enabling practical magnetic-core memory, where tiny ferrite rings stored bits through directional magnetization, offering non-volatility, high reliability, and faster access than prior mechanical systems; this technology was notably employed in computers like the UNIVAC series for main memory applications. Magnetic-core systems, though semi-mechanical in assembly, proved robust for data retention but remained bulky due to the need for extensive wiring and cores. Concurrently, in 1956, IBM introduced the 305 RAMAC (Random Access Method of Accounting and Control), the first commercial hard disk drive, featuring 50 spinning aluminum platters with magnetic surfaces that provided 5 megabytes of non-volatile storage, revolutionizing data handling for business applications despite its room-sized footprint and high cost. These mechanical and early magnetic systems, while pioneering non-volatile data persistence, faced inherent constraints that spurred the shift to semiconductor technologies. Their large physical size—often requiring dedicated rooms—coupled with slow mechanical access speeds (milliseconds for drums and disks) and reliability issues from wear on moving parts like wires, tapes, and rotors, limited scalability for growing computational demands. By the mid-1950s, these drawbacks underscored the need for compact, faster, and more dependable electrical alternatives, setting the stage for semiconductor innovations.

Semiconductor non-volatile memory evolution

The development of semiconductor non-volatile memory (NVM) began in the 1960s, driven by the need for reliable data retention in integrated circuits beyond volatile alternatives. In 1967, Dawon Kahng and Simon Sze at Bell Laboratories invented the floating-gate MOSFET, introducing the first practical non-volatile semiconductor memory cell capable of charge storage for read-only memory (ROM) applications, which laid the foundation for subsequent erasable technologies. This innovation built on Kahng's earlier co-invention of the MOSFET in 1959 with Mohamed Atalla, a device central to modern semiconductors and recognized in the 2000 Nobel Prize in Physics for enabling semiconductor scaling, including NVM advancements. Bipolar programmable read-only memory (PROM) emerged around the same period, allowing one-time programming via fuse links in integrated circuits. The 1970s marked progress in erasable NVM with ultraviolet light-based erasure. In 1971, Dov Frohman at Intel developed the erasable programmable read-only memory (EPROM), utilizing a floating-gate structure to enable UV-erasure and electrical programming, which became a cornerstone for firmware storage. By 1978, Eli Harari at Hughes Aircraft (later Intel) invented electrically erasable PROM (EEPROM), allowing byte-level electrical erasure and reprogramming without external light, addressing EPROM's limitations for flexible data updates. Flash memory revolutionized density and cost in the 1980s. In 1984, Fujio Masuoka at presented NOR flash, a block-erasable architecture using floating gates for high-speed random access, building on earlier project work from 1980. Masuoka's team advanced this to NAND flash in 1987, enabling higher density through serial access and multi-level cells, which propelled mass storage in consumer devices. The 1990s and 2000s saw diversification into alternative NVM types to overcome flash scaling limits like charge leakage. In 1993, Ramtron International commercialized ferroelectric RAM (FRAM), leveraging ferroelectric materials for non-volatile, low-power operation in embedded systems. IBM demonstrated the first magnetoresistive RAM (MRAM) prototype in 1996, using magnetic tunnel junctions for spin-based data retention, targeting cache-like performance. Throughout the 2000s, IBM advanced phase-change memory (PCM) research, achieving prototypes with chalcogenide materials for fast switching and endurance exceeding flash. From the 2010s onward, scaling and integration drove commercialization of emerging NVM. In 2008, HP Labs (in collaboration with Intel) demonstrated ReRAM using memristor-based crossbar arrays, enabling dense, low-voltage resistive switching for beyond-3D architectures. Everspin Technologies began production of spin-transfer torque MRAM (STT-MRAM) in 2016, offering 256 Mb densities with DRAM speeds and non-volatility for enterprise storage. These innovations addressed challenges like endurance and power, with the embedded NVM market projected to reach $3.3 billion by 2030, fueled by eMRAM, ePCM, and eReRAM in MCUs and SoCs.

Electrically addressed non-volatile memories

Read-only and write-once devices

Read-only and write-once devices represent foundational forms of semiconductor non-volatile memory designed for permanent or single-use data storage, where the content is fixed during or immediately after manufacturing and cannot be altered thereafter. These technologies prioritize reliability for unchanging data such as firmware, boot code, and configuration parameters in embedded systems, offering advantages in cost and density for high-volume production but sacrificing flexibility compared to erasable alternatives. Mask read-only memory (MROM), also known as masked ROM, is programmed with fixed data directly during the semiconductor fabrication process through custom masking and metallization layers that encode a permanent bit pattern into the chip's circuitry. This approach enables high-density storage at low per-unit cost, making MROM ideal for mass-produced applications where the data content is known in advance and does not require changes. For instance, MROM achieves densities in the range of megabits to gigabits per chip in advanced nodes, such as a 16-Mb implementation at 40 nm using dual trench isolation diode bitcells for efficient predefined data storage. Programmable read-only memory (PROM) extends the concept by allowing users to program the device once after manufacturing, typically by applying high-voltage pulses to blow fusible links or metal fuses that permanently alter the circuit paths. Invented in 1956 by Wen Tsing Chow at the American Bosch Arma Corporation for military applications like ICBM guidance, PROM became commercially available in the late 1960s and early 1970s, with early devices such as a 512-bit bipolar TTL version introduced by Radiation Inc. in 1970. This one-time programming capability provided flexibility for custom firmware without the need for full mask redesigns, though it still results in non-reversible content. One-time programmable (OTP) ROM serves as a modern variant of PROM, often integrated into standard CMOS processes using antifuse bit cells that are programmed via dielectric breakdown to create conductive paths, ensuring irreversible data fixation. OTP devices are particularly suited for storing secure keys, device identifiers, and calibration data in applications requiring tamper-resistant, non-alterable information, such as in microcontrollers and sensors. Examples include 1T or 2T antifuse cells developed since the early 2000s for embedded non-volatile storage without additional masks. These devices share key characteristics, including infinite read endurance due to their passive storage mechanisms that do not degrade with repeated access, the absence of any erase functionality, and non-volatility that retains data indefinitely without power. Densities can reach gigabit scales in contemporary implementations, supporting large firmware images, though their primary drawback is post-programming inflexibility, which limits use to scenarios with stable requirements. In modern contexts as of 2025, MROM, PROM, and OTP remain prevalent in cost-sensitive embedded systems, including microcontrollers for IoT devices and legacy game cartridges, where their simplicity and economy outweigh the need for rewritability.

Flash memory

Flash memory is a type of electrically addressed non-volatile memory that uses floating-gate transistors to store data as trapped charges, enabling repeated reprogramming unlike read-only devices. It dominates the non-volatile memory market, accounting for over 90% of shipments in 2025 due to its scalability and cost-effectiveness for mass storage. The technology was pioneered by at , who first described NOR flash in a 1984 IEDM paper and NAND flash in 1987, introducing the concept of block-erasable using Fowler-Nordheim tunneling. The core structure of flash memory relies on floating-gate metal-oxide-semiconductor field-effect transistors (FGMOSFETs), where a floating gate is isolated between the control gate and channel by insulating oxide layers, allowing charge storage to modulate the threshold voltage. NOR flash connects cells in parallel for random byte-level access, suitable for code execution, while NAND flash arranges cells in series for block-based operations, achieving higher density for data storage. This architectural difference makes NAND ideal for high-capacity applications, with densities scaling through multi-level cells. In 2025, advancements include SK hynix's mass production of 321-layer NAND flash. Programming and erasing in flash memory occur via Fowler-Nordheim tunneling, where high voltages (typically 15-20 V) enable quantum tunneling of electrons through the thin tunnel oxide into or out of the floating gate. The threshold voltage shift from injected charge is given by ΔVth=QinjectedCox\Delta V_{th} = \frac{Q_{injected}}{C_{ox}} where QinjectedQ_{injected} is the injected charge and CoxC_{ox} is the oxide capacitance per unit area, determining the cell's logic state. Cells are categorized by bits per cell: single-level cells (SLC) store 1 bit for high endurance, multi-level cells (MLC) store 2 bits, triple-level cells (TLC) 3 bits, and quad-level cells (QLC) 4 bits, trading reliability for density in modern devices. To overcome planar scaling limits, 3D stacking emerged in the 2010s, vertically layering word lines and channels, with commercial products reaching 200+ layers by 2025, such as SK hynix's 321-layer NAND in mass production. This architecture boosts capacity while maintaining cell size, using techniques like charge-trap flash for better uniformity over floating gates. Performance includes read times of 10-100 μs, write/erase times around 1 ms, endurance of 10³-10⁵ program/erase cycles depending on cell type (e.g., 10⁵ for SLC, 10³ for QLC), and of at least 10 years at 55°C. Flash memory powers solid-state drives (SSDs) for computing storage and USB flash drives for portable data transfer, with NAND comprising the bulk due to its density. Challenges include limited endurance, addressed by wear-leveling algorithms that distribute writes evenly across blocks, and increasing error rates mitigated by low-density parity-check (LDPC) codes for error correction.

Ferroelectric RAM (FRAM)

Ferroelectric RAM (FRAM), also known as FeRAM, is a type of non-volatile random-access memory that leverages the ferroelectric properties of certain materials to store data. In ferroelectric materials, such as or hafnium oxide (HfO₂), the application of an electric field induces a reversible polarization of the crystal lattice, creating two stable states that represent binary data: one for logic 0 and one for logic 1. This hysteresis effect allows the polarization to remain even after the field is removed, providing non-volatility without the need for constant power. The fundamental physics behind FRAM's data retention is described by the relationship between polarization PP, electric field EE, and material susceptibility χ\chi, given by the equation: P=ϵ0χEP = \epsilon_0 \chi E where ϵ0\epsilon_0 is the permittivity of free space. In ferroelectric materials, this relationship is nonlinear, exhibiting a hysteresis loop with a remnant polarization PrP_r that persists without an applied field, enabling stable data storage. FRAM employs a 1T-1C cell structure, consisting of one transistor and one ferroelectric capacitor per bit, similar to DRAM but with ferroelectric dielectrics replacing conventional oxides. During a write operation, an electric field is applied across the capacitor to align the polarization in the desired direction. Reads are destructive: sensing the charge on the capacitor disturbs the polarization state, necessitating an immediate write-back to restore the original data. Access times are typically around 50 ns, approaching DRAM speeds, while write cycles are fast and low-energy due to the minimal charge required to switch polarization. Endurance exceeds 10¹² cycles, far surpassing many other non-volatile memories. The concept of ferroelectric memory emerged in the 1950s with early research by organizations like Bell Labs and IBM exploring polarization effects in ceramics. Commercial development accelerated in the 1980s, culminating in the first FRAM chip from Ramtron International in 1993. By the 2000s, companies like Fujitsu integrated FRAM into microcontrollers for automotive and industrial uses. As of 2025, advancements include NXP's radiation-tolerant FRAM for aerospace applications and continued embedding in MCUs by RAMXEED (formerly Fujitsu Semiconductor Memory Solution), supporting densities up to 1 Mbit with enhanced reliability. FRAM's key advantages include operation at low voltages (1-3 V), ultra-low power consumption during writes, and inherent radiation hardness, making it suitable for embedded systems, smart meters, and space applications. However, challenges persist in scaling below 10 nm due to ferroelectric material fatigue and integration complexities, alongside higher fabrication costs compared to or DRAM.

Magnetoresistive RAM (MRAM)

Magnetoresistive random-access memory (MRAM) stores data using the magnetic states of ferromagnetic layers within a magnetic tunnel junction (MTJ), leveraging the tunneling magnetoresistance (TMR) effect for non-volatile retention. The MTJ consists of two ferromagnetic layers separated by a thin insulating barrier, typically magnesium oxide (MgO); one layer is fixed (pinned) while the other is free, allowing its magnetization direction to switch between parallel and antiparallel alignments relative to the fixed layer. In spin-transfer torque (STT) MRAM, the dominant modern variant, data writing occurs by passing a spin-polarized current through the MTJ, which exerts torque on the free layer's magnetization to flip its state without requiring an external magnetic field. The TMR effect quantifies the resistance difference between these states, defined as TMR=RAPRPRP×100%,TMR = \frac{R_{AP} - R_P}{R_P} \times 100\%, where RAPR_{AP} and RPR_P are the resistances in the antiparallel (high-resistance, logic '1') and parallel (low-resistance, logic '0') configurations, respectively, enabling reliable state detection. Reading in MRAM is non-destructive, achieved by applying a small sensing current to measure the MTJ's resistance change, distinguishing high and low states with high fidelity due to TMR ratios often exceeding 150%. Write operations in STT-MRAM typically require currents around 100 μA for sub-20 nm junctions, with access times of 10-35 ns, supporting high-speed embedded applications. Unlike charge-based memories, MRAM's magnetic storage avoids leakage currents, contributing to its low standby power. The development of MRAM began with a 1996 IBM prototype demonstrating field-induced switching in a 1 Mb array using early giant magnetoresistance principles, marking the first functional MRAM device. Commercialization advanced with Everspin Technologies' 2011 release of a 4 Mb standalone STT-MRAM product, transitioning from older toggle-mode designs to more scalable STT mechanisms. By 2025, TSMC has integrated 22 nm STT-MRAM into production for embedded applications, achieving densities up to 64 Mb with improved yield and reliability suitable for automotive and edge AI uses. STT-MRAM offers unlimited write endurance (>10^{15} cycles), data retention exceeding 10 years at elevated temperatures, and lower overall power consumption compared to , making it ideal for last-level caches and persistent storage. However, challenges persist in scaling write currents as junction sizes shrink below 20 nm, potentially increasing error rates and energy demands without . Variants include the older toggle MRAM, which used magnetic fields for switching but suffered from higher power and complexity, and emerging spin-orbit (SOT)-MRAM, which routes write currents parallel to the MTJ for reduced power and faster operation in cache hierarchies.

Phase-change memory (PCM)

Phase-change memory (PCM) relies on the reversible phase transitions of chalcogenide materials, such as alloys in the Ge-Sb-Te (GST) family, to store data non-volatily. These materials, like Ge₂Sb₂Te₅, exhibit two distinct states: an amorphous phase with high electrical resistance, typically representing the binary "0" state, and a crystalline phase with low resistance, representing the "1" state. The transition between these states is induced by controlled thermal processes, leveraging the material's ability to switch rapidly without mechanical movement. In operation, data writing involves via electrical current pulses applied through the memory cell. The "set" operation crystallizes the material by heating it to around 150–300°C for a sustained period (typically 10–100 ns), allowing atomic rearrangement into an ordered lattice that reduces resistance. The "reset" operation amorphizes the material by rapidly heating it above its (followed by quick to prevent recrystallization), increasing resistance; this also occurs on a nanosecond timescale. Reading is performed non-destructively by applying a low-voltage to measure the cell's resistance, which differentiates the states by orders of magnitude. Access times for read/write operations range from 10–100 ns, with demonstrated endurance exceeding 10⁹ cycles per cell. As of 2025, has announced production-ready embedded PCM solutions for automotive and industrial microcontrollers. Key thermal parameters govern these transitions, including the melting temperature Tmelt600CT_{melt} \approx 600^\circ \text{C} for Ge₂Sb₂Te₅, which sets the threshold for amorphization. The reset current IresetI_{reset} required for scales approximately as IresetΔT/ρI_{reset} \propto \sqrt{\Delta T / \rho}
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